Безопасность информационных технологий (Apr 2017)

Single Event Effects Rate Calculation with Different Models

  • A I Chumakov,
  • V M Uzhegov,
  • A O Akhmetov,
  • D V Boychenko,
  • A V Yanenko,
  • N V Ryasnoy

DOI
https://doi.org/10.26583/bit.2017.1.09
Journal volume & issue
Vol. 24, no. 1
pp. 73 – 84

Abstract

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The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested. It is based on operational reliability failure probability and SEE failure probability (harsh environment) comparison.

Keywords