Overall performance evaluation using an equivalent circuit model for radio-frequency single-electron transistors

Abstract

Charge sensitivities of a radio-frequency single-electron transistor (RF-SET) by using amplitude (AD) and phase-shift detection (PSD) of the reflected RF signals were experimentally studied. It was found that AD is most sensitive at the resonant frequency while PSD is most sensitive at a frequency slightly off the resonance. The best PSD sensitivity is better than the best AD one when the quality factor of a tank circuit is higher than 10; the higher Q-value is, the superior PSD. The maximal change in reflection amplitude and phase-shift were found proportional to the SET conductance change. The above experimental findings were confirmed by the calculation based on an equivalent circuit model.