Scientific Reports (Nov 2021)

A novel AlGaN/GaN heterostructure field-effect transistor based on open-gate technology

  • Yang Liu,
  • Yuanjie Lv,
  • Shuoshuo Guo,
  • Zhengfang Luan,
  • Aijie Cheng,
  • Zhaojun Lin,
  • Yongxiong Yang,
  • Guangyuan Jiang,
  • Yan Zhou

DOI
https://doi.org/10.1038/s41598-021-01917-9
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 12

Abstract

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Abstract In this study, a novel AlGaN/GaN heterostructure field-effect transistor based on open-gate technology was fabricated. Sample transistors of different structures and sizes were constructed. Through measurements, it was found that by changing the width of the opening, the threshold voltage of the device could be easily modulated across a larger range. The open-gate device had two working modes with different transconductance. When the gate-source voltage V GS ≤ − 4.5 V, only the open region was conductive, and a new working mechanism modulated the channel current. Corresponding theoretical analysis and calculations showed that its saturation mechanism was related to a virtual gate formed by electron injection onto the surface. Also, the gate-source voltage modulated the open channel current by changing the channel electron mobility through polarization Coulomb field scattering. When used as class-A voltage amplifiers, open-gate devices can achieve effective voltage amplification with very low power consumption.