A novel method for SIFT features matching based on feature dimension matching degree

Abstract

We proposes a method for fast matching SIFT feature points based on SIFT feature descriptor vector element matching. First, we discretize each dimensional feature element into an array address based on a fixed threshold value and store the corresponding feature point labels in an address. If the same dimensional feature element of the descriptor vector has the same discrete value, their feature point labels may fall into the same address. Secondly, we search the mapping address of the feature descriptor vector element to obtain the matching state of the corresponding dimensions of the feature descriptor vector, thus obtaining the number of dimensions matching between feature points and feature dimension matching degree. Then we use the feature dimension matching degree to obtain the suspect matching feature points. Finally we use the Euclidean distance to eliminate the mismatching feature points to obtain accurate matching feature point pairs. The method is essentially a high-dimensional feature vector matching method based on local feature vector element matching. Experimental results show that the new algorithm can guarantee the number of matching SIFT feature points and their matching accuracy and that its running time is similar to that of HKMT, RKDT and LSH algorithms