Direct high-resolution X-ray imaging exploiting pseudorandomness

KyeoReh Lee; Jun Lim; Su Yong Lee; YongKeun Park

doi:10.1038/s41377-023-01124-3

Light: Science & Applications (Apr 2023)

Direct high-resolution X-ray imaging exploiting pseudorandomness

KyeoReh Lee,
Jun Lim,
Su Yong Lee,
YongKeun Park

Affiliations

KyeoReh Lee: Department of Physics, Korea Advanced Institute of Science and Technology
Jun Lim: Pohang Accelerator Laboratory, Pohang University of Science and Technology
Su Yong Lee: Pohang Accelerator Laboratory, Pohang University of Science and Technology
YongKeun Park: Department of Physics, Korea Advanced Institute of Science and Technology

DOI: https://doi.org/10.1038/s41377-023-01124-3
Journal volume & issue: Vol. 12, no. 1
pp. 1 – 13

Abstract

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High-resolution X-ray sample field image is directly retrieved in a single shot using the mathematical relations of spatially pseudorandom (i.e., speckle) fields.

Published in Light: Science & Applications

ISSN: 2047-7538 (Online)
Publisher: Nature Publishing Group
Country of publisher: United Kingdom
LCC subjects: Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics; Science: Physics: Optics. Light
Website: https://www.nature.com/lsa/

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