Automatic device for measuring of principal thermoelectric parameters of lead chalcogenides

Abstract

The device intended for measuring of principal thermoelectric parameters of the narrow-gap lead chalcogenide semiconductors (the Seebeck coefficient, electrical conductivity and thermal conductivity) have been created. The device created can be controlled by personal computer. In the temperature range from 270K to 500K the correctness of values of the thermoelectric parameters measured by the device are following: thermal conductivity – ±5,7%; electrical conductivity – ±3,5%; the Seebeck coefficient – ±4%.

Keywords

• automatic device
• lead chalcogenide semiconductor
• thermoelectric parameter
• seebeck coefficient
• electrical conductivity
• thermal conductivity