Remote Sensing (Jul 2023)

Trap-Based Pest Counting: Multiscale and Deformable Attention CenterNet Integrating Internal LR and HR Joint Feature Learning

  • Jae-Hyeon Lee,
  • Chang-Hwan Son

DOI
https://doi.org/10.3390/rs15153810
Journal volume & issue
Vol. 15, no. 15
p. 3810

Abstract

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Pest counting, which predicts the number of pests in the early stage, is very important because it enables rapid pest control, reduces damage to crops, and improves productivity. In recent years, light traps have been increasingly used to lure and photograph pests for pest counting. However, pest images have a wide range of variability in pest appearance owing to severe occlusion, wide pose variation, and even scale variation. This makes pest counting more challenging. To address these issues, this study proposes a new pest counting model referred to as multiscale and deformable attention CenterNet (Mada-CenterNet) for internal low-resolution (LR) and high-resolution (HR) joint feature learning. Compared with the conventional CenterNet, the proposed Mada-CenterNet adopts a multiscale heatmap generation approach in a two-step fashion to predict LR and HR heatmaps adaptively learned to scale variations, that is, changes in the number of pests. In addition, to overcome the pose and occlusion problems, a new between-hourglass skip connection based on deformable and multiscale attention is designed to ensure internal LR and HR joint feature learning and incorporate geometric deformation, thereby resulting in improved pest counting accuracy. Through experiments, the proposed Mada-CenterNet is verified to generate the HR heatmap more accurately and improve pest counting accuracy owing to multiscale heatmap generation, joint internal feature learning, and deformable and multiscale attention. In addition, the proposed model is confirmed to be effective in overcoming severe occlusions and variations in pose and scale. The experimental results show that the proposed model outperforms state-of-the-art crowd counting and object detection models.

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