Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission

Shigenori Ueda; Masaki Mizuguchi

doi:10.35848/1882-0786/ad5e33

Applied Physics Express (Jan 2024)

Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission

Shigenori Ueda,
Masaki Mizuguchi

Affiliations

Shigenori Ueda: ORCiD; Research Center for Electronic and Optical Materials, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan; Synchotron X-ray Station at SPring-8, NIMS, Sayo, Hyogo 679-5148, Japan
Masaki Mizuguchi: ORCiD; Institute of Materials and Systems for Sustainability, Nagoya University , Nagoya, Aichi 464-8603, Japan; Graduate School of Engineering, Nagoya University , Nagoya, Aichi 464-8603, Japan; Cutting-edge, International Research Units, Nagoya University Institute for Advanced Study, Nagoya University, Nagoya, Aichi 464-8603, Japan; Center for Spintronics Research Network, Osaka University , Toyonaka, Osaka 560-8531, Japan

DOI: https://doi.org/10.35848/1882-0786/ad5e33
Journal volume & issue: Vol. 17, no. 7
p. 075501

Abstract

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Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2 p -Fe 3 d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only the bulk band but also the buried interface band of heterojunctions.

Published in Applied Physics Express

ISSN: 1882-0778 (Print); 1882-0786 (Online)
Publisher: IOP Publishing
Country of publisher: United Kingdom
LCC subjects: Science: Physics
Website: https://iopscience.iop.org/journal/1882-0786

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