ITM Web of Conferences (Jan 2018)

Evaluation of accuracy of SiC-JFET macromodel

  • Bargieł Kamil,
  • Bisewski Damian

DOI
https://doi.org/10.1051/itmconf/20181901027
Journal volume & issue
Vol. 19
p. 01027

Abstract

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In the paper, the results of experimental verification of the macromodel of UJN1208K JFET transistor made of silicon carbide fabricated by United Silicon Carbide, are presented. The macromodel form dedicated for PSPICE program is available on the manufacturer's website. The accuracy of the macromodel have been evaluated by comparison of selected calculated and measured static characteristics and C-V characteristics of the considered transistor. The influence of ambient temperature on the characteristics of the transistor has been evaluated, as well.