A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Wei Zhao; Song Liu; Hai Wang; Yan Liu; Shengkang Zhang; Chunyue Cheng; Keming Feng; Ilja Ocket; Dominique Schreurs; Bart Nauwelaers; Hongbo Qin; Xiaodong Yang

doi:10.3390/app7090866

Applied Sciences (Aug 2017)

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Wei Zhao,
Song Liu,
Hai Wang,
Yan Liu,
Shengkang Zhang,
Chunyue Cheng,
Keming Feng,
Ilja Ocket,
Dominique Schreurs,
Bart Nauwelaers,
Hongbo Qin,
Xiaodong Yang

Affiliations

Wei Zhao: Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, China
Song Liu: Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, China
Hai Wang: School of Aerospace Science and Technology, Xidian University, Xi’an 710071, China
Yan Liu: Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, China
Shengkang Zhang: Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, China
Chunyue Cheng: Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, China
Keming Feng: Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, China
Ilja Ocket: Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium
Dominique Schreurs: Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium
Bart Nauwelaers: Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium
Hongbo Qin: Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, China
Xiaodong Yang: School of Electronic Engineering, Xidian University, Xi’an 710071, China

DOI: https://doi.org/10.3390/app7090866
Journal volume & issue: Vol. 7, no. 9
p. 866

Abstract

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This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.

Published in Applied Sciences

ISSN: 2076-3417 (Online)
Publisher: MDPI AG
Country of publisher: Switzerland
LCC subjects: Technology: Engineering (General). Civil engineering (General); Science: Biology (General); Science: Physics; Science: Chemistry
Website: http://www.mdpi.com/journal/applsci

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