Microsystems & Nanoengineering (Apr 2023)

A 0.82 μVrms ultralow 1/f noise bandgap reference for a MEMS gyroscope

  • Junjun Zou,
  • Qi Wei,
  • Chunge Ju,
  • Hua Liao,
  • Haoyu Gu,
  • Bowen Xing,
  • Bin Zhou,
  • Rong Zhang

DOI
https://doi.org/10.1038/s41378-023-00505-3
Journal volume & issue
Vol. 9, no. 1
pp. 1 – 11

Abstract

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Abstract High-precision microelectromechanical system (MEMS) gyroscopes are significant in many applications. Bias instability (BI) is an important parameter that indicates the performance of a MEMS gyroscope and is affected by the 1/f noise of the MEMS resonator and readout circuit. Since the bandgap reference (BGR) is an important block in the readout circuit, reducing its 1/f noise is key to improving a gyroscope’s BI. In a traditional BGR, the error amplifier is applied to provide a virtual short-circuit point, but it introduces the main low-frequency noise sources. This paper proposes an ultralow 1/f noise BGR by removing the error amplifier and applying an optimized circuit topology. In addition, a simplified but accurate noise model of the proposed BGR is obtained to optimize the BGR’s output noise performance. To verify this design, the proposed BGR has been implemented in a 180 nm CMOS process with a chip area of 545 × 423 μm. The experimental results show that the BGR’s output integrated noise from 0.1 to 10 Hz is 0.82 μV and the thermal noise is 35 nV/√Hz. Furthermore, bias stability tests of the MEMS gyroscope fabricated in our laboratory with the proposed BGR and some commercial BGRs are carried out. Statistical results show that reducing the BGR’s 1/f noise can nearly linearly improve the gyroscope’s BI.