AIP Advances (Aug 2014)

Effect of electric field concentration using nanopeak structures on the current–voltage characteristics of resistive switching memory

  • Shintaro Otsuka,
  • Tomohiro Shimizu,
  • Shoso Shingubara,
  • Katsunori Makihara,
  • Seiichi Miyazaki,
  • Atsushi Yamasaki,
  • Yusuke Tanimoto,
  • Kouichi Takase

DOI
https://doi.org/10.1063/1.4892823
Journal volume & issue
Vol. 4, no. 8
pp. 087110 – 087110-7

Abstract

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An attempt to reduce the SET voltage and RESET current of resistive switching (RS) memory was made using a geometric array of nanopeak (NP) structures. Bottoms of anodic porous alumina were used to form the NP structures that act as guides for the formation of conductive filaments that effectively concentrate the electric field. Samples were fabricated with flat surfaces (FS) and with two types of NP structure with different NP pitch. The NP samples provided SET voltages less than 2 V with narrow distributions and the RESET current was lower than that with the FS sample.