Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
Laurie J. Phillips,
Atef M. Rashed,
Robert E. Treharne,
James Kay,
Peter Yates,
Ivona Z. Mitrovic,
Ayendra Weerakkody,
Steve Hall,
Ken Durose
Affiliations
Laurie J. Phillips
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
Atef M. Rashed
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
Robert E. Treharne
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
James Kay
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
Peter Yates
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
Ivona Z. Mitrovic
Department of Electrical Engineering and Electronics, University of Liverpool, Brownlow Hill, Liverpool L69 3GJ, UK
Ayendra Weerakkody
Department of Electrical Engineering and Electronics, University of Liverpool, Brownlow Hill, Liverpool L69 3GJ, UK
Steve Hall
Department of Electrical Engineering and Electronics, University of Liverpool, Brownlow Hill, Liverpool L69 3GJ, UK
Ken Durose
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
