Meta-Surface Slide for High-Contrast Dark-Field Imaging
Jianan Shao,
Ruiyi Chen,
Dehua Zhu,
Yu Cao,
Wenwen Liu,
Wei Xue
Affiliations
Jianan Shao
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
Ruiyi Chen
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
Dehua Zhu
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
Yu Cao
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
Wenwen Liu
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
Wei Xue
Zhejiang Provincial Key Laboratory of Laser Processing Robotics, College of Mechanical and Electrical Engineering, Wenzhou University, Wenzhou 325035, China
A label-free microscopy technology, dark-field microscopy, is widely used for providing high-contrast imaging for weakly scattering materials and unstained samples. However, traditional dark-field microscopes often require additional components and larger condensers as the numerical aperture increases. A solution to this is the use of a meta-surface slide. This slide utilizes a multilayer meta-surface and quantum dots to convert incident white light into a red glow cone emitted at a larger angle. This enables the slide to be used directly with conventional biological microscopy to achieve dark-field imaging. This paper focuses on the design and preparation of the meta-surface and demonstrates that using the meta-surface in a standard transmission optical microscope results in a dark-field image with higher contrast than a bright-field image, especially when observing samples with micron-sized structures.