Realizing depth measurement and edge detection based on a single metasurface
Yang Siwen,
Wei Qunshuo,
Zhao Ruizhe,
Li Xin,
Zhang Xue,
Li Yao,
Li Junjie,
Jing Xiaoli,
Li Xiaowei,
Wang Yongtian,
Huang Lingling
Affiliations
Yang Siwen
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Wei Qunshuo
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Zhao Ruizhe
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Li Xin
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Zhang Xue
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Li Yao
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
Li Junjie
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China
Jing Xiaoli
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Li Xiaowei
Laser Micro/Nano-Fabrication Laboratory, School of Mechanical Engineering, Beijing Institute of Technology, Beijing, 100081, China
Wang Yongtian
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
Huang Lingling
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China
How to simultaneously obtain the depth, edge, and other light information of the scene to accurately perceive the physical world is an important issue for imaging systems. However, such tasks usually require bulky optical components and active illumination methods. Here, we design and experimentally validate a single geometric metasurface that can achieve depth measurement or edge detection under incoherent or coherent light respectively. Double helix point source function is utilized, and three verification experiments are carried out, including double-helix beam calibration, 2D object and 3D object detection, respectively. Additionally, two-dimensional edge detection can also be achieved. This compact imaging system can enable new applications in various fields, from machine vision to microscopy.
