Structural and morphological data of RF-Sputtered BiVO4 thin films
R. Venkatesan,
S. Velumani,
K. Ordon,
M. Makowska-Janusik,
G. Corbel,
A. Kassiba
Affiliations
R. Venkatesan
Department of Electrical Engineering (SEES), CINVESTAV-IPN, Zacatenco, Av IPN #2508, Col Zacatenco, D.F. C.P. 07360, Mexico; Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France
S. Velumani
Department of Electrical Engineering (SEES), CINVESTAV-IPN, Zacatenco, Av IPN #2508, Col Zacatenco, D.F. C.P. 07360, Mexico; Corresponding authors.
K. Ordon
Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France; Institute of Physics, Jan Dlugosz University in Czestochowa, Al.Armii Krajowej, 13/15, 42 200 Czestochowa, Poland
M. Makowska-Janusik
Institute of Physics, Jan Dlugosz University in Czestochowa, Al.Armii Krajowej, 13/15, 42 200 Czestochowa, Poland
G. Corbel
Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France
A. Kassiba
Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France; Corresponding authors.
Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1 h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.
