QTL mapping of adult plant resistance to stripe rust and leaf rust in a Fuyu 3/Zhengzhou 5389 wheat population
Takele Weldu Gebrewahid,
Peipei Zhang,
Yue Zhou,
Xiaocui Yan,
Xianchun Xia,
Zhonghu He,
Daqun Liu,
Zaifeng Li
Affiliations
Takele Weldu Gebrewahid
Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Baoding 071001, Hebei, China; College of Agriculture, Aksum University-Shire Campus, Tigray, Ethiopia
Peipei Zhang
Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Baoding 071001, Hebei, China
Yue Zhou
Baoding University, Baoding 071001, Hebei, China
Xiaocui Yan
Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Baoding 071001, Hebei, China
Xianchun Xia
Institute of Crop Sciences, National Wheat Improvement Center, Chinese Academy of Agricultural Sciences, Beijing 100081, China
Zhonghu He
Institute of Crop Sciences, National Wheat Improvement Center, Chinese Academy of Agricultural Sciences, Beijing 100081, China; International Maize and Wheat Improvement Center (CIMMYT) China Office, c/o CAAS, Beijing 100081, China
Daqun Liu
Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Baoding 071001, Hebei, China; Corresponding authors.
Zaifeng Li
Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Baoding 071001, Hebei, China; Corresponding authors.
Stripe or yellow rust (YR) and leaf rust (LR) cause large losses in wheat production worldwide. Resistant cultivars curtail the levels of losses. The present study aimed to identify quantitative trait loci (QTL) for YR and LR resistance in 147 F2:6 recombinant inbred lines (RIL) derived from the cross Fuyu 3/Zhengzhou 5389. The RIL population and parents were genotyped with the Wheat55K single nucleotide polymorphism (SNP) array and simple sequence repeat (SSR) markers. All materials were also phenotyped for YR severity at Mianyang in Sichuan province and Baoding in Hebei province in the 2015/2016, 2016/2017, and 2017/2018 cropping seasons, and LR severity at Zhoukou in Henan province and at Baoding in 2017/2018. Eleven QTL for YR resistance and five for LR resistance were detected using inclusive composite interval mapping (IciMapping). Four of these QTL on chromosomes 1BL, 2BS, 3AL, and 5AL conferred resistance to both YR and LR. The QTL on 1BL was Lr46/Yr29, and that on 7BL might be Lr68. The QTL on chromosome 2BS was detected at a similar position to previously detected loci. QYr.hebau-3AL/QLr.hebau-3AL, QYr.hebau-5AL/QLr.hebau-5AL, QYr.hebau-7DL, QYr.hebau-4BS, QYr.hebau-6DL, and QYr.hebau-2AS are likely to be new. An SSR marker for QYr.hebau-7DL was developed and validated in a diverse wheat panel from China, suggesting effectiveness in different genetic backgrounds. These QTL with closely linked SNP and SSR markers could be useful for marker-assisted selection in wheat breeding programs targeting durable resistance to both diseases.
