Journal of Synchrotron Radiation (Sep 2023)

High-resolution and high-sensitivity X-ray ptychographic coherent diffraction imaging using the CITIUS detector

  • Yukio Takahashi,
  • Masaki Abe,
  • Hideshi Uematsu,
  • Shuntaro Takazawa,
  • Yuhei Sasaki,
  • Nozomu Ishiguro,
  • Kyosuke Ozaki,
  • Yoshiaki Honjo,
  • Haruki Nishino,
  • Kazuo Kobayashi,
  • Toshiyuki Nishiyama Hiraki,
  • Yasumasa Joti,
  • Takaki Hatsui

DOI
https://doi.org/10.1107/S1600577523004897
Journal volume & issue
Vol. 30, no. 5
pp. 989 – 994

Abstract

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Ptychographic coherent diffraction imaging (PCDI) is a synchrotron X-ray microscopy technique that provides high spatial resolution and a wide field of view. To improve the performance of PCDI, the performance of the synchrotron radiation source and imaging detector should be improved. In this study, ptychographic diffraction pattern measurements using the CITIUS high-speed X-ray image detector and the corresponding image reconstruction are reported. X-rays with an energy of 6.5 keV were focused by total reflection focusing mirrors, and a flux of ∼2.6 × 1010 photons s−1 was obtained at the sample plane. Diffraction intensity data were collected at up to ∼250 Mcounts s−1 pixel−1 without saturation of the detector. Measurements of tantalum test charts and silica particles and the reconstruction of phase images were performed. A resolution of ∼10 nm and a phase sensitivity of ∼0.01 rad were obtained. The CITIUS detector can be applied to the PCDI observation of various samples using low-emittance synchrotron radiation sources and to the stability evaluation of light sources.

Keywords