Research on Sparse Representation Method of Acoustic Microimaging Signals

Abstract

Acoustic microimaging (AMI), a technology for high-resolution imaging of materials using a scanning acoustic microscope, has been widely used for non-destructive testing and evaluation of electronic packages. Recently, the internal features and defects of electronic packages have reached the resolution limits of conventional time domain or frequency domain AMI methods with the miniaturization of electronic packages. Various time-frequency domain AMI methods have been developed to achieve super-resolution. In this paper, the sparse representation of AMI signals is studied, and a constraint dictionary-based sparse representation (CD-SR) method is proposed. First, the time-frequency parameters of the atom dictionary are constrained according to the AMI signal to constitute a constraint dictionary. Then, the AMI signal is sparsely decomposed using the matching pursuit algorithm, and echoes selection and echoes reconstruction are performed. The performance of CD-SR was quantitatively evaluated by simulated and experimental ultrasonic A-scan signals. The results demonstrated that CD-SR has superior longitudinal resolution and robustness.

Keywords

• non-destructive testing and evaluation
• acoustic microimaging
• sparse representation
• super-resolution