APL Materials
(Feb 2018)
Covalent nitrogen doping in molecular beam epitaxy-grown and bulk WSe2
Ava Khosravi,
Rafik Addou,
Christopher M. Smyth,
Ruoyu Yue,
Christopher R. Cormier,
Jiyoung Kim,
Christopher L. Hinkle,
Robert M. Wallace
Affiliations
Ava Khosravi
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Rafik Addou
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Christopher M. Smyth
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Ruoyu Yue
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Christopher R. Cormier
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Jiyoung Kim
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Christopher L. Hinkle
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
Robert M. Wallace
Department of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, Richardson, Texas 75080, USA
DOI
https://doi.org/10.1063/1.5002132
Journal volume & issue
Vol. 6,
no. 2
pp.
026603
– 026603-7
Abstract
Read online
Covalent p-type doping of WSe2 thin films grown by molecular beam epitaxy and WSe2 exfoliated from bulk crystals is achieved via remote nitrogen plasma exposure. X-ray photoelectron and Raman spectroscopies indicate covalently bonded nitrogen in the WSe2 lattice as well as tunable nitrogen concentration with N2 plasma exposure time. Furthermore, nitrogen incorporation induces compressive strain on the WSe2 lattice after N2 plasma exposure. Finally, atomic force microscopy and scanning tunneling microscopy reveal that N2 plasma treatment needs to be carefully tuned to avoid any unwanted strain or surface damage.
Published in APL Materials
ISSN
2166-532X (Online)
Publisher
AIP Publishing LLC
Country of publisher
United States
LCC subjects
Technology: Chemical technology: Biotechnology
Science: Physics
Website
http://aplmaterials.aip.org
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