An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

Abstract

This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

Keywords

• bandgap voltage reference
• brokaw
• bcd
• emc
• hf immunity
• kuijk
• offset
• temperature drift
• tsividis