Nature Communications (Jan 2016)

Unlocking new contrast in a scanning helium microscope

  • M. Barr,
  • A. Fahy,
  • J. Martens,
  • A. P. Jardine,
  • D. J. Ward,
  • J. Ellis,
  • W. Allison,
  • P. C. Dastoor

DOI
https://doi.org/10.1038/ncomms10189
Journal volume & issue
Vol. 7, no. 1
pp. 1 – 5

Abstract

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Scanning helium microscopy uses neutral atoms to image traditionally challenging materials (e.g. delicate, insulating and magnetic samples) non-destructively with absolute surface sensitivity. This work reports the first observation of chemical contrast in helium microscopy via inelastic scattering.