Metals (Apr 2024)

A Full-Field Crystal Plasticity Study on the Bauschinger Effect Caused by Non-Shearable Particles and Voids in Aluminium Single Crystals

  • Arash Imani Aria,
  • Bjørn Holmedal,
  • Tomas Mánik,
  • Knut Marthinsen

DOI
https://doi.org/10.3390/met14040424
Journal volume & issue
Vol. 14, no. 4
p. 424

Abstract

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In the present work, the goal is to use two-scale simulations to be incorporated into the full-field open software DAMASK version 2.0.3 crystal plasticity framework, in relation to the Bauschinger effect caused by the composite effect of the presence of second-phase particles with surrounding deformation zones. The idea is to achieve this by including a back stress of the critical resolved shear stress in a single-phase simulation, as an alternative to explicitly resolving the second-phase particles in the system. The back stress model is calibrated to the volume-averaged behaviour of detailed crystal plasticity simulations with the presence of hard, non-shearable spherical particles or voids. A simplified particle-scale model with a periodic box containing only one of the spherical particles in the crystal is considered. Applying periodic boundary conditions corresponds to a uniform regular distribution of particles or voids in the crystal. This serves as an idealised approximation of a particle distribution with the given mean size and particle volume fraction. The Bauschinger effect is investigated by simulating tensile–compression tests with 5% and 10% volume fractions of particles and with 1%, 2%, and 5% pre-strain. It is observed that an increasing volume fraction increases the Bauschinger effect, both for the cases with particles and with voids. However, increasing the pre-strain only increases the Bauschinger effect for the case with particles and not for the case with voids. The model with back stress of the critical resolved shear stress, but without the detailed particle simulation, can be fitted to provide reasonably close results for the volume-averaged response of the detailed simulations.

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