Application Research on Life Extension of Missile-Borne Electronic Equipment HALT

Abstract

For selecting more suitable stress of accelerated life test, based on the environmental characte-ristics and the requirements of highly accelerated life test (HALT) of a certain missile mission, a HALT method for the missile-borne electronic equipment is proposed. Taking a typical component of a missile-borne electronic equipment as an example, based on the analysis of the component structure, the main failure mode of the component is determined, and the sensitive stresses affecting the performance of the component is analyzed. Accor-ding to the need of life extension, the HALT scheme of the component is designed and the working limit value of the component under different sensitive stresses is obtained by test, which provides guidance for the life extension work.

Keywords

• |missile-borne electronic equipment|halt|accelerated life test|life extension