Structural Modification of Single-Layer Graphene Under Laser Irradiation Featured by Micro-Raman Spectroscopy

Abstract

Abstract Confocal micro-Raman spectroscopy is used as a sensitive tool to study the nature of laser-induced defects in single-layer graphene. Appearance and drastic intensity increase of D- and D′ modes in the Raman spectra at high power of laser irradiation is related to generation of structural defects. Time- and power-dependent evolution of Raman spectra is studied. The dependence of relative intensity of defective D- and D′ bands is analyzed to relate the certain types of structural defects. The surface density of structural defects is estimated from the intensity ratio of D- and G bands using the D-band activation model. Unusual broadening of the D band and splitting of the G band into G− and G+ components with redistribution of their intensities is observed at high laser power and exposition. Position of the G+ band is discussed in relation with nonuniform doping of graphene with charge impurities. Simultaneous presence in the Raman spectra of heavily irradiated graphene of rather narrow G band and broaden D band is explained by coexistence within the Raman probe of more and less damaged graphene areas. This assumption is additionally confirmed by confocal Raman mapping of the heavily irradiated area.

Keywords

• Graphene
• Micro-Raman spectroscopy
• Double electron-phonon resonance mechanism
• Structural defects
• Laser irradiation
• Exposure dose