Simultaneously measuring microwave electric fields at different frequencies by Rydberg-atom-based electrometry with Zeeman-resolved Autler–Townes splitting
Yuxiang Wang,
Yuqing Liu,
Qianyi Zhang,
Pengwei Gong,
Wen Xie,
Zinan Wu,
Fengdong Jia,
Zhi-Ping Zhong
Affiliations
Yuxiang Wang
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Yuqing Liu
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Qianyi Zhang
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Pengwei Gong
Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Radio Metrology and Measurement, Beijing 100854, China
Wen Xie
Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Radio Metrology and Measurement, Beijing 100854, China
Zinan Wu
Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Radio Metrology and Measurement, Beijing 100854, China
Fengdong Jia
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Zhi-Ping Zhong
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
We provide the simultaneous traceable measurements of microwave electric fields at two different frequencies by the electromagnetically induced transparency (EIT) and Autler–Townes (AT) splitting. A static magnetic field working together with a linearly polarized probe and coupling light prepares Rydberg atoms in Zeeman sublevels with maximal |mJ| in an atomic vapor cell. Using the EIT-AT splitting of these two maximal |mJ| states, the microwave electric fields at two different frequencies are simultaneously measured, in which their frequency difference can be adjustable within the linear range of magnetic field-induced level shifts. The proposed method provides a promising prospect for calibrating multiple microwave frequencies simultaneously in the future.
