EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION

Abstract

With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.

Keywords

• дефект
• отказ
• надежность
• пробой диэлектрика