Applied Physics Express (Jan 2024)

Time-resolved force microscopy using the delay-time modulation method

  • Hiroyuki Mogi,
  • Rin Wakabayashi,
  • Shoji Yoshida,
  • Yusuke Arashida,
  • Atsushi Taninaka,
  • Katsuya Iwaya,
  • Takeshi Miura,
  • Osamu Takeuchi,
  • Hidemi Shigekawa

DOI
https://doi.org/10.35848/1882-0786/ad0c04
Journal volume & issue
Vol. 17, no. 1
p. 015003

Abstract

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We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in bulk WSe _2 , which is challenging owing to the effect of the tunneling current in time-resolved scanning tunneling microscopy. The obtained results were comprehensively explained with the model based on the dipole-dipole interaction induced by photo illumination.

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