Nature Communications (Dec 2022)

Focus image scanning microscopy for sharp and gentle super-resolved microscopy

  • Giorgio Tortarolo,
  • Alessandro Zunino,
  • Francesco Fersini,
  • Marco Castello,
  • Simonluca Piazza,
  • Colin J. R. Sheppard,
  • Paolo Bianchini,
  • Alberto Diaspro,
  • Sami Koho,
  • Giuseppe Vicidomini

Journal volume & issue
Vol. 13, no. 1
pp. 1 – 14


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Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).