Physical Review Accelerators and Beams (Jul 2018)

Experiments on bright-field and dark-field high-energy electron imaging with thick target material

  • Zheng Zhou,
  • Yingchao Du,
  • Shuchun Cao,
  • Zimin Zhang,
  • Wenhui Huang,
  • Huaibi Chen,
  • Rui Cheng,
  • Zhijun Chi,
  • Ming Liu,
  • Xiaolu Su,
  • Chuanxiang Tang,
  • Qili Tian,
  • Wei Wang,
  • Yanru Wang,
  • Jiahao Xiao,
  • Lixin Yan,
  • Quantang Zhao,
  • Yunliang Zhu,
  • Youwei Zhou,
  • Yang Zong,
  • Wei Gai

DOI
https://doi.org/10.1103/PhysRevAccelBeams.21.074701
Journal volume & issue
Vol. 21, no. 7
p. 074701

Abstract

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High-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from an S-band photoinjector, where scattered electrons, after interacting with a sample, are collected and imaged by a quadrupole imaging system. We achieve a spatial resolution of a few microns (∼4 μm) and a thickness resolution of a few percent for a silicon target of 300–600 μm in thickness. With additional dark-field images captured by selecting electrons with large scattering angles, we show that complementary information for determining external details such as outlines, boundaries and defects can be obtained.