The origin of {113}<361> grains and their impact on secondary recrystallization in producing ultra-thin grain-oriented electrical steel

Abstract

Ultra-thin grain-oriented electrical steel with a thickness of 80 µm is produced by one-step-rolling with industrial grain-oriented electrical steel. The research employs electron back-scattering texture analysis technique to investigate the evolution of deformation and recrystallization textures in this specific steel. Emphasis is placed on examining the origin of {113} grains and their consequential impact on secondary recrystallization. It is revealed that primary, secondary, and tertiary recrystallization phases are integral during the annealing process. The origin of surface {113} grains were result of initial deviated Goss grains with specific shear deformation behavior in cold rolled ultra-thin strips. Additionally, the influence of these grains on texture evolution is predominantly evident during secondary recrystallization. These grains potentially undergo abnormal growth in secondary recrystallization, exploiting high-energy grain boundaries among Goss grains. This phenomenon consequently leads to the diminution of the sharp Goss texture formed during primary recrystallization. Given the magnetic properties and predominant applications of ultra-thin grain-oriented electrical steel in medium-frequency fields, it is recommended to prepare ultra-thin grain-oriented steel during primary recrystallization phase.

Keywords

• ultra-thin grain-oriented electrical steel
• {113}
• <361>
• grains
• goss texture
• secondary recrystallization