Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters

Abstract

This paper deals with the application of the support vector machine (SVM) and the least-squares SVM regressions to the uncertainty quantification of complex systems with a high-dimensional parameter space. The above regression techniques are used to build accurate and compact surrogate models of the system responses from a limited set of training samples. The accuracy and the feasibility of the proposed modeling techniques are then investigated by comparing their results with the ones predicted by a sparse polynomial chaos expansion by considering two real-life problems with 8 and 30 random variables, respectively.

Keywords

• Machine learning
• uncertainty quantification
• parameterized modeling
• surrogate models
• SVM regression
• LS-SVM regression