Fast Algorithm for Rough-Surface Scene Simulation in Passive Millimeter Wave Imaging

Chuan Yin; Youlin Geng; Yujian Pan; Huayan Jin

doi:10.1109/ACCESS.2018.2827020

IEEE Access (Jan 2018)

Fast Algorithm for Rough-Surface Scene Simulation in Passive Millimeter Wave Imaging

Chuan Yin,
Youlin Geng,
Yujian Pan,
Huayan Jin

Affiliations

Chuan Yin: ORCiD; College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China
Youlin Geng: College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China
Yujian Pan: College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China
Huayan Jin: College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China

DOI: https://doi.org/10.1109/ACCESS.2018.2827020
Journal volume & issue: Vol. 6
pp. 25051 – 25059

Abstract

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Simulation in the passive millimeter-wave (MMW) imaging of rough surfaces is an indispensable step in the simulation in passive radiation imaging. The multi-layer brightness temperature tracing method (MBTTM) can be used to simulate the image of a rough surface, which has been proven in our previous work. However, it causes a significant decrease in efficiency of the simulation. To solve this problem, a fast MBTTM is proposed in this paper. In the new method, the uniformly emission method and multi-layer densification method are presented. To validate the correctness of the new algorithm, the comparison of the simulation and measurement results are proposed. These results are in good agreement, which indicates that the fast MBTTM can notably shorten the computing time of the simulation of the roughsurface scene.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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