Journal of Materials Research and Technology (May 2022)

Mechanical stability of lamellar microstructure in TiAl:an atomic-scale study

  • Wen Li,
  • Qian Xu,
  • Wen Yu,
  • Jianxin Zhou,
  • Hai Nan,
  • Xu Shen,
  • Yajun Yin,
  • Xiaoyuan Ji

Journal volume & issue
Vol. 18
pp. 745 – 754

Abstract

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Mechanical stability of lamellar microstructure in γ-TiAl has been studied, for the first time, from the perspective of three different γ/γ lamellar interfaces evolution at atomic scale via molecular dynamics simulations. Results indicate that small lamellar spacing promotes the formation of longitudinal twinning, thus influences the mechanical stability of TiAl lamellar structure. Pseudo-twin (PT) and rotational boundary (RB) lamellar interfaces transfer to each other while the true-twin (TT) lamellar interface migrates directly and annihilates resulting from interaction with longitudinal twinning during deformation. Therefore, compared with the TiAl lamellar structure with TT interface, structure with PT and RB interfaces exhibit higher mechanical stability.

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