Observation of Micro-Scale Domain Structure Evolution under Electric Bias in Relaxor-Based PIN-PMN-PT Single Crystals
Kai Li,
Huashan Zheng,
Xudong Qi,
Shan Cong,
Zhenting Zhao,
Junfeng Zhao,
Haijuan Mei,
Duoduo Zhang,
Enwei Sun,
Limei Zheng,
Weiping Gong,
Bin Yang
Affiliations
Kai Li
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Huashan Zheng
Condensed Matter Science and Technology Institute, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, China
Xudong Qi
Key Laboratory for Photonic and Electronic Bandgap Materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin 150025, China
Shan Cong
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Zhenting Zhao
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Junfeng Zhao
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Haijuan Mei
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Duoduo Zhang
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Enwei Sun
Condensed Matter Science and Technology Institute, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, China
Limei Zheng
School of Physics, State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China
Weiping Gong
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516001, China
Bin Yang
Condensed Matter Science and Technology Institute, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, China
Relaxor ferroelectrics play a vital role as functional components in electromechanical devices. The observation of micro-scale domain structure evolution under electric bias in relaxor ferroelectrics has posed challenges due to their complex domain morphology characterized by small-sized domains. The present study aims to investigate the dielectric diffusion–relaxation characteristics, domain structure, and domain switching evolution under electric bias in high-performance single crystals of Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-33PbTiO3. The findings reveal the presence of strip-like domain patterns that interlock irregular small-sized nanodomains in PIN-PMN-33PT single crystals. Furthermore, the sample undergoes three distinct stages under electric bias, including the nucleation of new domains, the gradual forward expansion of domains, and the lateral expansion of domains. These observations provide valuable insights for understanding and exploring domain engineering techniques in relaxor ferroelectrics.
