Deep Learning assisted X-ray Microscopy Characterization of Nickel based Metal Matrix composite reinforced with TiC

• Yanamandra Kaushik,
• Bale Hrishikesh,
• Banerjee Rajarshi,
• Mitchell Ria

Affiliations

Yanamandra Kaushik

Carl Zeiss Research Microscopy Solutions

Bale Hrishikesh

Carl Zeiss Research Microscopy Solutions

Banerjee Rajarshi

Materials Science and Engineering, University of North Texas

Mitchell Ria

Carl Zeiss Research Microscopy Solutions