EPJ Web of Conferences (Jan 2022)

Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods

  • Barion Antonio,
  • Anthonissen Martijn J. H.,
  • ten Thije Boonkkamp Jan H. M.,
  • IJzerman Wilbert L.

DOI
https://doi.org/10.1051/epjconf/202226602002
Journal volume & issue
Vol. 266
p. 02002

Abstract

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The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results for a single reflector. The concatenation of multiple mirrors follows from the mathematical framework.