Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions

Abstract

The lack of labeled data and variable working conditions brings challenges to the application of intelligent fault diagnosis. Given this, extracting labeled information and learning distribution-invariant representation provides a feasible and promising way. Enlightened by metric learning and semi-supervised architecture, a triplet-guided path-interaction ladder network (Tri-CLAN) is proposed based on the aspects of algorithm structure and feature space. An encoder–decoder structure with path interaction is built to utilize the unlabeled data with fewer parameters, and the network structure is simplified by CNN and an element additive combination activation function. Metric learning is introduced to the feature space of the established algorithm structure, which enables the mining of hard samples from extremely limited labeled data and the learning of working condition-independent representations. The generalization and applicability of Tri-CLAN are proved by experiments, and the contribution of the algorithm structure and the metric learning in the feature space are discussed.

Keywords

• intelligent fault diagnosis
• semi-supervised
• metric learning
• limited labeled sample
• variable working condition