Electronics Letters (Mar 2024)

Identifying exploitable memory objects for out‐of‐bound write vulnerabilities

  • Runhao Li,
  • Bin Zhang,
  • Chaojing Tang

DOI
https://doi.org/10.1049/ell2.13136
Journal volume & issue
Vol. 60, no. 5
pp. n/a – n/a

Abstract

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Abstract Exploiting an out‐of‐bounds write vulnerability in general‐purpose applications has become a current research focus. Given the large scale of code in programs, selecting appropriate memory objects for exploitation is challenging. This letter proposes a corrupted data propagation‐guided fuzzing method. By tracking the propagation process of corrupted data among memory objects, a multi‐level fuzzing schedule is proposed to search the execution paths. Experimental results show that this proposed method, EMOFuzz, can effectively identify exploitable objects under various overflow lengths, significantly enhancing the efficiency of exploitability analysis.

Keywords