PhytoFrontiers (Apr 2024)
Grain Yield and Quality Losses Caused by Tan Spot in Wheat Cultivars in Australia
Abstract
Tan spot (TS), known in Australia as yellow leaf spot, is caused by the fungal pathogen Pyrenophora tritici-repentis, a major foliar disease of wheat. Four experiments were conducted between 2016 and 2017 in two different climatic zones of southeastern Australia to determine the impact of TS on grain yield and quality in six wheat cultivars with different resistance ratings. In each experiment, high and low TS disease scenarios were applied to each cultivar. Disease severity was assessed as either whole-plot percentage leaf area affected (%LAA) or top three leaf (flag to flag-2) %LAA. Whole-plot %LAA was analyzed using both repeated measurements and area under the disease progress curve (AUDPC). For whole-plot %LAA, the repeated measurements identified differences in epidemic progression at key growth stages not identified through AUDPC. Both AUDPC and end-of-season flag to flag-2 %LAA were negatively correlated with grain yield and screenings. Increased rainfall impacting disease development and number of rain days above 5 mm increased TS severity across both climatic zones. Cultivar resistance ratings influenced grain yield loss, with moderately resistant, moderately susceptible, and susceptible cultivars losing up to 6, 18, and 24% grain yield, respectively. High disease significantly increased screenings by up to 1, 3, and 5% for moderately resistant, moderately susceptible, and susceptible cultivars, respectively. This study demonstrated that TS can cause significant grain yield losses in southeastern Australia, and a minimum cultivar rating of moderate resistance to moderate susceptibility was required to prevent severe TS and associated grain yield and quality losses. [Figure: see text] Copyright © 2024 The Author(s). This is an open access article distributed under the CC BY-NC-ND 4.0 International license.
Keywords
