3D Optical Measuring Systems and Laser Technologies for Scientific and Industrial Applications

Chugui Yu.; Verkhoglyad A.; Poleshchuk A.; Korolkov V.; Sysoev E.; Zavyalov P.

doi:10.2478/msr-2013-0048

Measurement Science Review (Dec 2013)

3D Optical Measuring Systems and Laser Technologies for Scientific and Industrial Applications

Chugui Yu.,
Verkhoglyad A.,
Poleshchuk A.,
Korolkov V.,
Sysoev E.,
Zavyalov P.

Affiliations

Chugui Yu.: Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences (TDI SIE SB RAS), 41, Russkaya str., Novosibirsk, 630058, Russia
Verkhoglyad A.: Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences (TDI SIE SB RAS), 41, Russkaya str., Novosibirsk, 630058, Russia
Poleshchuk A.: Institute of Automation and Electrometry, Siberian Branch of the Russian Academy of Sciences (IAE SB RAS), 1, Academician Koptyug prosp., Novosibirsk,630090, Russia
Korolkov V.: Institute of Automation and Electrometry, Siberian Branch of the Russian Academy of Sciences (IAE SB RAS), 1, Academician Koptyug prosp., Novosibirsk,630090, Russia
Sysoev E.: Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences (TDI SIE SB RAS), 41, Russkaya str., Novosibirsk, 630058, Russia
Zavyalov P.: Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences (TDI SIE SB RAS), 41, Russkaya str., Novosibirsk, 630058, Russia

DOI: https://doi.org/10.2478/msr-2013-0048
Journal volume & issue: Vol. 13, no. 6
pp. 322 – 328

Abstract

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Modern industry and science require novel 3D optical measuring systems and laser technologies with micro/nanometer resolution for solving actual problems. Such systems, including the 3D dimensional inspection of ceramic parts for electrotechnical industry, laser inspection of wheel pair diagnostic for running trains and 3D superresolution low-coherent micro- /nanoprofilometers are presented. The newest results in the field of laser technologies for high-precision synthesis of microstructures by updated image generator using the semiconductor laser are given. The measuring systems and the laser image generator developed and produced by TDI SIE and IAE SB RAS have been tested by customers and used in different branches of industry and science.

Published in Measurement Science Review

ISSN: 1335-8871 (Online)
Publisher: Sciendo
Country of publisher: Poland
LCC subjects: Science: Mathematics
Website: https://sciendo.com/journal/MSR

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