Effect of thickness and annealing of the Si(001)2×1-Cu wetting layer on the morphology of layered nanofilms based on Fe, Co, and Cu and their ferromagnetic properties

Abstract

Layered nanofilms based on Fe, Co, and Cu were grown on Si(001)2×1-Cu wetting layers with thicknesses of 1 and 2 ML and studied using the AES, EELS, and LEED methods in an ultrahigh vacuum chamber. After unloading into air, the samples were studied by AFM and MOKE methods. It was found that an increase in the thickness and annealing of the Si(001)2×1-Cu wetting layer increase the agglomeration of nanofilms and, as a consequence, their magnetization and coercive force. Although, annealing the Cu wetting layer reduces the degree of squareness of the magnetic hysteresis loop.

Keywords

• multilayer films
• wetting layer
• growth
• agglomeration
• morphology
• metals
• silicon substrate
• hysteresis loop
• atomic force microscopy
• magneto-optical kerr effect