Dataset of ptychographic X-ray computed tomography of inverse opal photonic crystals produced by atomic layer deposition
Kaline P. Furlan,
Emanuel Larsson,
Ana Diaz,
Mirko Holler,
Tobias Krekeler,
Martin Ritter,
Alexander Yu. Petrov,
Manfred Eich,
Robert Blick,
Gerold A. Schneider,
Imke Greving,
Robert Zierold,
Rolf Janßen
Affiliations
Kaline P. Furlan
Institute of Advanced Ceramics, Hamburg University of Technology, Denickestraße 15, 21073 Hamburg, Germany; Center for Hybrid Nanostructures, Universität Hamburg, Luruper Chaussee 149, 22607 Hamburg, Germany; Corresponding author at: Institute of Advanced Ceramics, Hamburg University of Technology, Denickestraße 15, 21073 Hamburg, Germany.
Emanuel Larsson
Institute of Materials Research, Helmholtz-Zentrum Geesthacht, Max-Planck-Strasse 1, 21502 Geesthacht, Germany
Ana Diaz
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Mirko Holler
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Tobias Krekeler
Electron Microscopy Unit, Hamburg University of Technology, Eißendorfer Straße 42, 21073 Hamburg, Germany
Martin Ritter
Electron Microscopy Unit, Hamburg University of Technology, Eißendorfer Straße 42, 21073 Hamburg, Germany
Alexander Yu. Petrov
Institute of Optical and Electronic Materials, Hamburg University of Technology, Eißendorfer Straße 38, 21073 Hamburg, Germany; ITMO University, 49 Kronverkskii Avenue, 197101 St. Petersburg, Russia
Manfred Eich
Institute of Optical and Electronic Materials, Hamburg University of Technology, Eißendorfer Straße 38, 21073 Hamburg, Germany
Robert Blick
Center for Hybrid Nanostructures, Universität Hamburg, Luruper Chaussee 149, 22607 Hamburg, Germany
Gerold A. Schneider
Institute of Advanced Ceramics, Hamburg University of Technology, Denickestraße 15, 21073 Hamburg, Germany
Imke Greving
Institute of Materials Research, Helmholtz-Zentrum Geesthacht, Max-Planck-Strasse 1, 21502 Geesthacht, Germany
Robert Zierold
Center for Hybrid Nanostructures, Universität Hamburg, Luruper Chaussee 149, 22607 Hamburg, Germany
Rolf Janßen
Institute of Advanced Ceramics, Hamburg University of Technology, Denickestraße 15, 21073 Hamburg, Germany
This data article describes the detailed parameters for synthesizing mullite inverse opal photonic crystals via Atomic Layer Deposition (ALD), as well as the detailed image analysis routine used to interpret the data obtained by the measurement of such photonic crystals, before and after the heat treatment, via Ptychographic X-ray Computed Tomography (PXCT). The data presented in this article are related to the research article by Furlan and co-authors entitled “Photonic materials for high-temperature applications: Synthesis and characterization by X-ray ptychographic tomography” (Furlan et al., 2018). The data include detailed information about the ALD super-cycle process to generate the ternary oxides inside a photonic crystal template, the raw data from supporting characterization techniques, as well as the full dataset obtained from PXCT. All the data herein described is publicly available in a Mendeley Data archive “Dataset of synthesis and characterization by PXCT of ALD-based mullite inverse opal photonic crystals” located at https://data.mendeley.com/datasets/zn49dsk7x6/1 for any academic, educational, or research purposes.
