EPJ Web of Conferences (Jan 2023)

Patterning of SiO2 interfaces for radiative cooling applications

  • Zhenmin Ding,
  • Jérémy Werlé,
  • Xin Li,
  • Hongbo Xu,
  • Lei Pan,
  • Yao Li,
  • Lorenzo Pattelli

DOI
https://doi.org/10.1051/epjconf/202328704026
Journal volume & issue
Vol. 287
p. 04026

Abstract

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Silicon dioxide (SiO2) is a prominent material for radiative cooling applications due to its negligible absorption at solar wavelengths (0.25-2.5 µm) and exceptional stability. However, at thermal infrared wavelengths, its bulk phonon-polariton band introduces a strong reflection peak inside the atmospheric transparency window (8-13 µm) which is detrimental to its selective emissivity. Herein, we demonstrate scalable strategies for the patterning of ordered and disordered SiO2 metasurfaces enhancing their thermal emissivity and enabling sub-ambient passive cooling under direct sunlight.