Space- and time-resolved small angle X-ray scattering to probe assembly of silver nanocrystal superlattices

Abstract

How nanocrystals assemble into superlattices is poorly understood, given the difficulty of probing these processes in real time, in a controlled environment. Here, the authors use space- and time-resolved in situ small angle X-ray scattering to monitor the ordering of nanocrystal superlattices by electric field, which allows them to extract quantitative information about the assembly process.