Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy

Abstract

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [ 1 ¯ 12 ] M / / [ 0001 ] P and ( 1 1 ¯ 1 ) M / / ( 1 ¯ 100 ) P . A ledge growth interface with the preferred orientation along the [ 1 1 ¯ 1 ] M and [ 110 ] M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

Keywords

• transmission electron microscopy (TEM)
• traveling heater method
• precipitation
• interface structure
• defects in semiconductors
• CdZnTe