Nature Communications (Aug 2016)

Quantifying redox-induced Schottky barrier variations in memristive devices via in operando spectromicroscopy with graphene electrodes

  • Christoph Baeumer,
  • Christoph Schmitz,
  • Astrid Marchewka,
  • David N. Mueller,
  • Richard Valenta,
  • Johanna Hackl,
  • Nicolas Raab,
  • Steven P. Rogers,
  • M. Imtiaz Khan,
  • Slavomir Nemsak,
  • Moonsub Shim,
  • Stephan Menzel,
  • Claus Michael Schneider,
  • Rainer Waser,
  • Regina Dittmann

DOI
https://doi.org/10.1038/ncomms12398
Journal volume & issue
Vol. 7, no. 1
pp. 1 – 7

Abstract

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Resistive switching in metal oxides is related to the migration of donor defects. Here Baeumer et al. use in operandoX-ray spectromicroscopy to quantify the doping locally and show that small local variations in the donor concentration result in large variations in the device resistance.