Dual Attention-Based Industrial Surface Defect Detection with Consistency Loss

Abstract

In industrial production, flaws and defects inevitably appear on surfaces, resulting in unqualified products. Therefore, surface defect detection plays a key role in ensuring industrial product quality and maintaining industrial production lines. However, surface defects on different products have different manifestations, so it is difficult to regard all defective products as being within one category that has common characteristics. Defective products are also often rare in industrial production, making it difficult to collect enough samples. Therefore, it is appropriate to view the surface defect detection problem as a semi-supervised anomaly detection problem. In this paper, we propose an anomaly detection method that is based on dual attention and consistency loss to accomplish the task of surface defect detection. At the reconstruction stage, we employed both channel attention and pixel attention so that the network could learn more robust normal image reconstruction, which could in turn help to separate images of defects from defect-free images. Moreover, we proposed a consistency loss function that could exploit the differences between the multiple modalities of the images to improve the performance of the anomaly detection. Our experimental results showed that the proposed method could achieve a superior performance compared to the existing anomaly detection-based methods using the Magnetic Tile and MVTec AD datasets.

Keywords

• surface defect detection
• anomaly detection
• industrial security
• attention mechanism