Solution of Inverse Photoacoustic Problem for Semiconductors via Phase Neural Network

Abstract

The inverse photoacoustic problem is an ill-posed mathematical physics problem. There are many methods of solving the inverse photoacoustic problem, from parameter reduction to the development of complex regularization algorithms. The idea of this work is that semiconductor physical properties are determined from phase characteristic measurements because phase measurements are more sensitive than amplitude measurements. To solve the inverse photoacoustic problem, the thermoelastic properties and thickness of the sample are estimated using a neural network approach. The neural network was trained on a large database of photoacoustic phases calculated from a theoretical Si n-type model in the range of 20 Hz to 20 kHz, to which random Gaussian noise was applied. It is shown that in solving the inverse photoacoustic problem, high accuracy and precision can be achieved by applying phase measurement and neural network approaches. This study showed that a multi-parameter inverse problem can be solved using phase networks.

Keywords

• inverse photoacoustic problem
• neural networks
• Gaussian random noise
• semiconductors
• photoacoustic phase characteristic