Open Physics (Jun 2009)
Structural, morphology and electrical properties of layered copper selenide thin film
- Ying Chyi Liew J.,
- Talib Zainal,
- Mahmood W.,
- Yunus M.,
- Zainal Zulkarnain,
- Halim Shaari,
- Moksin Mohd,
- Yusoff Wan,
- Pah Lim K.
Affiliations
- Ying Chyi Liew J.
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Talib Zainal
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Mahmood W.
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Yunus M.
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Zainal Zulkarnain
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Halim Shaari
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Moksin Mohd
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Yusoff Wan
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- Pah Lim K.
- Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysia
- DOI
- https://doi.org/10.2478/s11534-009-0057-1
- Journal volume & issue
-
Vol. 7,
no. 2
pp. 379 – 384
Abstract
No abstracts available.Keywords
- cuse thin films
- electrical conductivity
- surface roughness
- film thickness
- grain size
- 71.20.nr
- 72.20.-i
- 73.21.ac
- 73.25.+i
- 73.50.-h
